Position: Applications Development Engineer
Location: Milpitas, CA
Duration: Full time
Job Description:
The Wafer Inspection Division (WIN) of KLA-Tencor designs and manufactures systems that are used for capturing yield-impacting defects at the front-end-of-line (FEOL) and the back-end-of-line (BEOL). A successful candidate will be joining a world leader in wafer inspection products and technologies designing and manufacturing the next generation of products.
The Wafer Inspection Division (WIN) is seeking an Entry Level Applications Engineer to be based in our Milpitas office.
Responsibilities:
Responsible for supporting KLA-Tencor's wafer inspection products. Includes projects related to new product introduction: characterization, alpha testing, beta testing and pilot tools in the ramp phase. In addition, application engineers will manage in-house customer demonstrations and head-to-head (H2H) activities at customer facilities. Also, applications is responsible for generating best known method documents and other training material and transferring product knowledge to K-T's worldwide Field Applications team. Lastly, applications will work with customers to publish papers at industry symposiums or in technical journals. Work closely with many organizations including engineering, sales and marketing within K-T and with customer engineers outside K-T. Worldwide travel (on average 30%) is required to support inspection products at customer fabs.
Preferred Qualifications:
Candidate must have MS or Ph.D. in Engineering, Physics, Material Science or related fields. Having a background in IC processing/Semiconductor equipment is a plus. Must have excellent communication, organizational, analytical, leadership, and interpersonal skill. Candidate must also be self-driven, yet a strong team player.
Basic Qualification:
Bachelor's Level Degree with at least 1 year of experience
OR
Master's Level Degree
Kindly send your resume to raju.balaji@kla-tencor.com
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Posted by: Anonymous
Applications Development Engineer ( Optics | Wafer Inspection | IC Processing) (# 109613) Updated at :
11:04 AM
Thursday, August 1, 2013
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